Temperature Dependences of Losses in High Frequency Dielectrics
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Abstract
Temperature is one of the important factors that affect to the coefficient of dielectric loss. Currently electronics is actively developing in the gigahertz frequency range. The frequency growth leads to the increasing of dielectric self-heating in the microwave electric field. Heating of dielectrics might be caused also by the external sources of heat. This paper presents the investigation of temperature dependences of the microwave dielectric losses for different mechanisms of polarization. The results of mathematical modelling are shown as well. References 3, figures 6.
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References
Poplavko Y. (2013), “Dielectric spectroscopy of Solids”. Saarbrücken: Lambert Academic Publishing, P. 253. (Rus)
A.K. Tagantsev, V.O. Sherman, K.F. Astafiev, J. Venkatesh, N. Setter. (2003), “Ferroelectric Materials for Microwave Tunable Applications”. Journal of Electroceramics. Vol. 11. Pp. 5–66.
Tareev B.M. (1982), “Physics of dielectric materials”. Energoizdat, P. 320. (Rus)
