Measuring of the microwave materials parameters on the base of the inhomogeneous microstrip resonator method
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Abstract
In this paper the method for measuring the dielectric constant and dielectric loss tangent of the dielec-tric material in the microwave range of wavelengths using the inhomogeneous microstrip resonator is pre-sented. The measurement technique and the design of the measuring cell are described, the theoretical basis of the method and results of experimental studies are given.
Reference 9, figures 2, tables 1.
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References
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