UHF methods of measuring the parameters of the microwave dielectric materials based on composite dielectric resonator
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Abstract
The article analyzes the microwave methods for measuring the material parameters, showing their advantages and disadvantages, discussed the criteria for selecting the measurement method. The authors proposed a modification of the method of the composite dielectric resonator. The proposed method has a high sensitivity in the measurement of dielectric constant and loss.
References 4, figures 6, tables 1.
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References
Poplavko Y. M., Molchanov V. I., Kazmirenko V. A. (2011), “Microwave Dielectric Spectroskopy”. Kiev, NTUU «KPI». P. 304 p. (Ukr)
Harvey A. F. (1965), “Microwave Engineering”. Moskva, Sovetskoe Radio. Vol. 1, P. 784. (Rus)
Bovtun V., Pashkov V., Kempa M., Kamba S., Eremenko A., Molchanov V. [et al.] (2011), “An elec-trode-free method of characterizing the microwave dielectric properties of high-permittivity thin films”. Journal of Applied Physics. 024106, pp. 109–115.
Pashkov V.M., Bovtun V.P., Prokopenko Y.V., Kempa M., Molchanov V.I., Eremenko A.V., Poplavko Y.M. (2009), “The Method of Measuring the Characteristics of the Microwave Dielectric Films”. // Mi-crowave & Telecommunication Technology (CriMiCo-2009) : Proc. of 19th Int. Sci. Conf. (Sept. 14–18, 2009, Sevastopol, Crimea, Ukraine), pp. 769–770. (Rus)
