Radiation-heat treatment of high-power bipolar transistors with anti-multiplication layer
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Abstract
Tne influence of alpha-particles irradiation on parameters of power bipolar transistors with voltage dividing layer in bulk collector region was investigated. It was shown the switch off time of collector current was decreased in two times in result of such treatments
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Borysov, A. V., Husev, V. A., & Murzyn, D. H. (2012). Radiation-heat treatment of high-power bipolar transistors with anti-multiplication layer. Electronics and Communications, 17(5), 5–9. https://doi.org/10.20535/2312-1807.2012.17.5.217938
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Solid-state electronics

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References
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