Modern research methods structural and information properties of natural systems

Main Article Content

A.B. Zavhorodniy

Abstract

A new application of a method which allows a quantitative assessment of the nanostructure order was offered. The possibility of the application of methods and techniques for structural- morphologic analysis based on the fractal dimension of the images obtained by gas discharge visualization was highlighted

Article Details

How to Cite
Zavhorodniy, A. . (2010). Modern research methods structural and information properties of natural systems. Electronics and Communications, 15(1), 60–65. https://doi.org/10.20535/2312-1807.2010.15.1.313010
Section
Informational systems and technologies

References

S. Zenin, Structural state of water as a basis for managing the behavior and safety of living systems: dis. doctor of biological sciences, 1999, p. 207

E. Davenas, “Human basophil degranulation triggered by very dilute antiserum against IgE”, Nature, vol. 333, no. 6176, pp. 816–818, Jun. 1988. DOI:10.1038/333816a0

M. Lebedev, “Mechanism of adsorption of H2S molecules on the GaAs(100) surface: quantum-chemical analysis from first principles”, Solid State Physics, vol. 48, no. 1, pp. 152–158, 2006.

S. Chesters, H. Wang, and G. Kasper, “A fractalbased method for describing surface roughnessand texture”, Proc. of Institute of EnvironmentalScience, p. 316, 1990.

N. Gerasimenko and S. Aprelov, “Fractal methods for analyzing the degree of ordering of nanostructures”, Russian nanotechnologies, vol. 2, no. 1–2, pp. 136–139, 2007.

J. Li, L. Lu, Y. Su, and M. O. Lai, “Fractal-based description for the three-dimensional surface of materials”, Journal of Applied Physics, vol. 86, no. 5, pp. 2526–2532, Sep. 1999. DOI:10.1063/1.371087

P. I. Oden, A. Majumdar, B. Bhushan, A. Padmanabhan, and J. J. Graham, “AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces”, Journal of Tribology, vol. 114, no. 4, pp. 666–674, Oct. 1992. DOI:10.1115/1.2920934

A. Hedman, Surface Characterization and Applications to Atomic Force Microscopy: Graduate diploma thesis, Luleå University of Technology, 1994, p. 102.

J. M. Gómez-Rodríguez, A. M. Baró, and R. C. Salvarezza, “Fractal characterization of gold deposits by scanning tunneling microscopy”, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, vol. 9, no. 2, pp. 495–499, Mar. 1991. DOI:10.1116/1.585554

S. K. Sinha, “X-ray diffuse scattering as a probe for thin film and interface structure”, Journal de Physique III, vol. 4, no. 9, pp. 1543–1557, Sep. 1994. DOI:10.1051/jp3:1994221

J. Arnault, A. Knoll, E. Smigiel, and A. Cornet, “Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements”, Applied Surface Science, vol. 171, no. 3-4, pp. 189–196, Feb. 2001. DOI:10.1016/S0169-4332(00)00550-X

T. Roch, “X-ray studies on self-organized wires in SiGe/Si multilayers”, Journal of Physics D: Applied Physics, vol. 34, no. 10A, pp. A6-A10, May 2001. DOI:10.1088/0022-3727/34/10A/302

N. Gerasimenko, M. Pavlyuchenko, and K. Djamanbalin, “Fractal analysis of the surface of CoSi2 obtained by ion synthesis”, News of Universities: Electronics, no. 6, pp. 75–79, 2002.

E. Feder, Fractals, Moscow: Mir, 1991, p. 254.

Y. Klikushin, “Fractal scale for measuring the shape of probability distributions”, Journal of Radio Electronics, no. 3, pp. 15–18, 2000.