Electrical properties of nanostructured silicon layers, obtained by a chemical method

Main Article Content

T.YU. Bilyk

Abstract

In the paper further investigation of correlation between properties and formation conditions of nanostructured layers is performed. In this work dependence of nanoporous silicon layer properties from formation time is studied and charge transfers regimes are investigated by differentiate analysis. Etching time increment results on decrement of layer conductivity and formation of unidirectional potential hill

Article Details

How to Cite
Bilyk, T. . (2010). Electrical properties of nanostructured silicon layers, obtained by a chemical method. Electronics and Communications, 15(3), 6–8. https://doi.org/10.20535/2312-1807.2010.15.3.305790
Section
Nanostructures and nanotechnology in electronics

References

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